发明名称 PROBE ASSEMBLY FOR ACCURATE SOLDERING
摘要 PURPOSE: A probe assembly is provided to remove the degradation of a solder. CONSTITUTION: A wiring board(20) forms a circuit pattern which includes a plurality of electrode pads in an upper part. A plurality of probes(10) comprises a bonding part welded in a plurality of electrode pads. A solder layer(30) is formed in the upper side of the plurality of electrode pads in order to be welded with the probe junction part and the electrode pad.
申请公布号 KR20100137240(A) 申请公布日期 2010.12.30
申请号 KR20090055565 申请日期 2009.06.22
申请人 TSE CO., LTD. 发明人 IN, CHI HUN;YOON, SOEK EON
分类号 G01R1/067;H01L21/60;H01L21/66 主分类号 G01R1/067
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