发明名称 |
PROBE ASSEMBLY FOR ACCURATE SOLDERING |
摘要 |
PURPOSE: A probe assembly is provided to remove the degradation of a solder. CONSTITUTION: A wiring board(20) forms a circuit pattern which includes a plurality of electrode pads in an upper part. A plurality of probes(10) comprises a bonding part welded in a plurality of electrode pads. A solder layer(30) is formed in the upper side of the plurality of electrode pads in order to be welded with the probe junction part and the electrode pad. |
申请公布号 |
KR20100137240(A) |
申请公布日期 |
2010.12.30 |
申请号 |
KR20090055565 |
申请日期 |
2009.06.22 |
申请人 |
TSE CO., LTD. |
发明人 |
IN, CHI HUN;YOON, SOEK EON |
分类号 |
G01R1/067;H01L21/60;H01L21/66 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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