发明名称 Fermi-level unpinning structures for semiconductive devices, processes of forming same, and systems containing same
摘要 An interlayer is used to reduce Fermi-level pinning phenomena in a semiconductive device with a semiconductive substrate. The interlayer may be a rare-earth oxide. The interlayer may be an ionic semiconductor. A metallic barrier film may be disposed between the interlayer and a metallic coupling. The interlayer may be a thermal-process combination of the metallic barrier film and the semiconductive substrate. A process of forming the interlayer may include grading the interlayer. A computing system includes the interlayer.
申请公布号 US2010327377(A1) 申请公布日期 2010.12.30
申请号 US20090459254 申请日期 2009.06.26
申请人 发明人 DEWEY GILBERT;MUKHERJEE NILOY;METZ MATTHEW;KAVALIEROS JACK T.;ZELICK NANCY M.;CHAU ROBERT S.
分类号 H01L29/78;H01L21/31;H01L21/3205;H01L29/06 主分类号 H01L29/78
代理机构 代理人
主权项
地址