发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 A semiconductor manufacturing method includes forming a word line crossing with an active region on a semiconductor substrate; forming a diffusion layer region; forming a first insulating film as high as a bit line to be formed; etching the first insulating film, while using, as a mask, a pattern having a linear aperture extending to the active region on the first insulating film so as to form a groove pattern for exposing the surface of the semiconductor substrate; embedding a conductive film in the groove pattern; forming a mask pattern passing over a portion, in which a bit contact is formed, on the first insulating film; and removing the first insulating film and the conductive layer until the upper layer insulating film of the word line is exposed, while using the mask pattern as a mask so as to isolate a bit contact from another contact.
申请公布号 US2010330802(A1) 申请公布日期 2010.12.30
申请号 US20100824381 申请日期 2010.06.28
申请人 ELPIDA MEMORY, INC. 发明人 OSHIMA HIROMITU
分类号 H01L21/768;H01L21/8242 主分类号 H01L21/768
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