发明名称 RADIO FREQUENCY IDENTIFICATION (RFID) DEVICE AND METHOD FOR TESTING THE SAME
摘要 A radio frequency identification (RFID) device and a test method thereof are disclosed. In this test method, the RFID device receives different kinds of tag selection addresses and memory addresses according to a time sharing scheme, so that one or more RFID tags are tested. The RFID device includes a tag chip and a test chip. The tag chip performs a test operation upon receiving a test input signal from an external node, and externally outputs a test output signal indicating a result of the test operation. The test chip tests the tag chip upon receiving an address and data from an external node via a test pad during a test mode.
申请公布号 US2010327877(A1) 申请公布日期 2010.12.30
申请号 US20090650524 申请日期 2009.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG HEE BOK;HONG SUK KYOUNG
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
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