发明名称 JIG FOR INSPECTING A SUBSTRATE
摘要 PURPOSE: A jig for the inspection of a substrate is provided to reduce the number of substrate contact parts which are contacted with the inspection point of a substrate by applying a terminal combining part. CONSTITUTION: A terminal part is connected to the four terminal of a substrate inspection device. A terminal combing part(215) combines a first terminal part with a second terminal part. A substrate contact part(270) is connected to the terminal combining part.
申请公布号 KR20100137322(A) 申请公布日期 2010.12.30
申请号 KR20090055688 申请日期 2009.06.22
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 JUNG, BYUNG WUL;KIM, HYUN JOON;SON, YEONG RAK
分类号 G01R31/02;G01R15/00 主分类号 G01R31/02
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