DETECTION OF DEFECTS IN AN ELECTROCHEMICAL DEVICE

摘要

The invention relates to a method for detecting defects in an electrochemical device, including obtaining (103) at least one characteristic value (Vali) dependent on at least one variable (S) received from the electrochemical device and determining (105) at least one defect (Di) in said device from the characteristic value obtained. The method comprises a mathematical operation including a wavelet transform, which operation is carried out in order to obtain the characteristic value (Vali) from the variable (S) received. The invention also relates to a device that carries out one such method, as well as to a corresponding computer program.