发明名称 SEMICONDCUTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 <p>Disclosed is a semiconductor device which is provided with a plurality of gate insulating films on a semiconductor substrate. Among the gate insulating films, the gate insulating film having the smallest film thickness in the HP transistor forming region is composed of a silicon oxide film, and the rest of the gate insulating films in the I/O transistor forming region and the transistor forming region are composed of a silicon oxynitride film.</p>
申请公布号 WO2010150332(A1) 申请公布日期 2010.12.29
申请号 WO2009JP07059 申请日期 2009.12.21
申请人 PANASONIC CORPORATION;UCHIYAMA, KEITA;YONEDA, KENJI 发明人 UCHIYAMA, KEITA;YONEDA, KENJI
分类号 H01L21/8234;H01L21/316;H01L27/088 主分类号 H01L21/8234
代理机构 代理人
主权项
地址