发明名称 DRAM transistor with a gate formed in a substrate trench
摘要 <p>The invention includes a transistor device (69) having a semiconductor substrate (12) with an upper surface. A pair of source/drain regions (41,59) are formed within the semiconductor substrate and a channel region (46) is formed within the semiconductor substrate and extends generally perpendicularly relative to the upper surface of the semiconductor substrate. A gate (54) is formed within the semiconductor substrate between the pair of the source/drain regions (41,59) and can surround the channel region and/or one of the source/drain regions.</p>
申请公布号 EP2267769(A2) 申请公布日期 2010.12.29
申请号 EP20100011474 申请日期 2005.08.29
申请人 MICRON TECHNOLOGY, INC. 发明人 SANH, TANG;HALLER, GORDON;BROWN, KRIS;EARL, ALLEN, T., III
分类号 H01L21/8242;H01L21/336;H01L27/108;H01L29/10;H01L29/417;H01L29/423;H01L29/78 主分类号 H01L21/8242
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