发明名称 |
SEMICONDUCTOR DEVICE AND PACKAGING METHOD THEREOF |
摘要 |
Electrodes (4) formed on the surface of a first resin sealed package (11) sealing a semiconductor chip (3) are connected to the electrodes (15) of the semiconductor chip (3). Each electrode (4) comprises a mounting area (101) connected to a substrate, carrier tape or other resin package on which the first resin package is mounted. Each electrode (4) also has a testing area (102) connected to the mounting area. The testing area is connectable to testing equipment. Therefore, the chip (3) can be tested without the test probe damaging the surface of the mounting area (101). The resin also seals the chip from the surrounding environment. Fig 5. |
申请公布号 |
SG166669(A1) |
申请公布日期 |
2010.12.29 |
申请号 |
SG20010045376 |
申请日期 |
2001.07.26 |
申请人 |
NEC ELECTRONICS CORPORATION |
发明人 |
ICHINOSE MICHIHIKO |
分类号 |
G01R31/26;G01R31/30;H01L21/60;H01L23/12;H01L23/31;H01L23/495;H01L23/58;H01L25/10;H01L25/11;H01L25/18 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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