发明名称 SEMICONDUCTOR DEVICE AND PACKAGING METHOD THEREOF
摘要 Electrodes (4) formed on the surface of a first resin sealed package (11) sealing a semiconductor chip (3) are connected to the electrodes (15) of the semiconductor chip (3). Each electrode (4) comprises a mounting area (101) connected to a substrate, carrier tape or other resin package on which the first resin package is mounted. Each electrode (4) also has a testing area (102) connected to the mounting area. The testing area is connectable to testing equipment. Therefore, the chip (3) can be tested without the test probe damaging the surface of the mounting area (101). The resin also seals the chip from the surrounding environment. Fig 5.
申请公布号 SG166669(A1) 申请公布日期 2010.12.29
申请号 SG20010045376 申请日期 2001.07.26
申请人 NEC ELECTRONICS CORPORATION 发明人 ICHINOSE MICHIHIKO
分类号 G01R31/26;G01R31/30;H01L21/60;H01L23/12;H01L23/31;H01L23/495;H01L23/58;H01L25/10;H01L25/11;H01L25/18 主分类号 G01R31/26
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