发明名称 CHARGED PARTICLE SELECTION APPARATUS AND CHARGED PARTICLE IRRADIATION APPARATUS
摘要 PURPOSE: A charged particle selection apparatus and a charged particle irradiation apparatus are provided to select an ionized cluster according to a mantissa by deflecting the ionized gas cluster by applying an AC voltage to the electrode. CONSTITUTION: More than three electric field applying units(21~23) apply an electric field in the propagation direction of a gas cluster. A slit(24) assorts the gas cluster. The slit comprises the opening on the extended line of the direction in which the gas cluster enters. The electric field applying unit is composed of two electrodes(22a, 22b).
申请公布号 KR20100136911(A) 申请公布日期 2010.12.29
申请号 KR20100038925 申请日期 2010.04.27
申请人 TOKYO ELECTRON LIMITED;HYOGO PREFECTURE 发明人 NARUSHIMA MASAKI;MORI KOICHI;YAMADA ISAO;TOYODA NORIAKI
分类号 H01J37/317;H01J49/22;H01J49/26 主分类号 H01J37/317
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