发明名称 |
System for testing a flat panel display device and method thereof |
摘要 |
A system for testing a flat panel display having a flat display panel assembly includes a testing stage for arranging the flat display panel assembly, a measuring apparatus being disposed on the testing stage and for measuring a spectrum of a transmitted light passing through a measuring region of the flat display panel assembly from a light source, a transporting apparatus for moving the measuring apparatus at a constant acceleration on the testing stage, a defect informing apparatus being electrically connected to the measuring apparatus and for informing an existence of defect, a type of defect, and a severity of defect by processing an electrical signal of the spectrum transmitted from the measuring apparatus.
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申请公布号 |
US7859274(B2) |
申请公布日期 |
2010.12.28 |
申请号 |
US20070279066 |
申请日期 |
2007.02.15 |
申请人 |
DONGJIN SEMICHEM CO., LTD. |
发明人 |
KIM BYUNG-UK;LEE KI-BEOM;KIM YONG-WOO;PARK MI-SUN;HONG JIN-SUP;KIM WY-YONG |
分类号 |
G01R31/302;G01R31/28;G01R31/305 |
主分类号 |
G01R31/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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