发明名称 System for testing a flat panel display device and method thereof
摘要 A system for testing a flat panel display having a flat display panel assembly includes a testing stage for arranging the flat display panel assembly, a measuring apparatus being disposed on the testing stage and for measuring a spectrum of a transmitted light passing through a measuring region of the flat display panel assembly from a light source, a transporting apparatus for moving the measuring apparatus at a constant acceleration on the testing stage, a defect informing apparatus being electrically connected to the measuring apparatus and for informing an existence of defect, a type of defect, and a severity of defect by processing an electrical signal of the spectrum transmitted from the measuring apparatus.
申请公布号 US7859274(B2) 申请公布日期 2010.12.28
申请号 US20070279066 申请日期 2007.02.15
申请人 DONGJIN SEMICHEM CO., LTD. 发明人 KIM BYUNG-UK;LEE KI-BEOM;KIM YONG-WOO;PARK MI-SUN;HONG JIN-SUP;KIM WY-YONG
分类号 G01R31/302;G01R31/28;G01R31/305 主分类号 G01R31/302
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