发明名称 Interferometric method for improving the resolution of a lithographic system
摘要 According to one exemplary embodiment of the present invention, a method for writing an arbitrary, two-dimensional pattern using interferometric lithography and classical techniques includes the steps of: (1) creating a pixel array defined by a number of pixels having specific coordinates; (2) mapping pixel information based on the desired pattern, the pixel information including a list of which pixels are activated to define the desired two-dimensional pattern; (3) controlling a relative strength of each pixel for indicating a feature height of a portion of the desired two-dimensional pattern; and (4) controlling a degree that one pixel is shifted in an x-direction and a y-direction relative to original coordinates of the pixel in order to define the desired two-dimensional pattern pixel by pixel.
申请公布号 US7859646(B2) 申请公布日期 2010.12.28
申请号 US20070763725 申请日期 2007.06.15
申请人 ADELPHI UNIVERSITY 发明人 BENTLEY SEAN J.
分类号 G03B27/54 主分类号 G03B27/54
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