发明名称 Memory device and semiconductor device
摘要 A memory device capable of data writing at a time other than during manufacturing is provided by using a memory element including an organic material. In a memory cell, a third conductive film, an organic compound, and a fourth conductive film are stacked over a semiconductor film provided with an n-type impurity region and a p-type impurity region, and a pn-junction diode is serially connected to the memory element. A logic circuit for controlling the memory cell includes a thin film transistor. The memory cell and the logic circuit are manufactured over one substrate at the same time. The n-type impurity region and the p-type impurity region of the memory cell are manufactured at the same time as the impurity region of the thin film transistor.
申请公布号 US7858972(B2) 申请公布日期 2010.12.28
申请号 US20070785964 申请日期 2007.04.23
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 TOKUNAGA HAJIME;KATO KIYOSHI
分类号 H01L35/24;H01L51/00 主分类号 H01L35/24
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