发明名称 Semiconductor package with improved size, reliability, warpage prevention, and heat dissipation and method for manufacturing the same
摘要 The semiconductor package includes a semiconductor package module with circuit patterns formed on an insulation substrate, at least two semiconductor chips electrically connected to each of the circuit patterns using bumps, and an insulation member filled in any open space in the semiconductor module. A cover plate is formed on the upper portion of the semiconductor package module, and a penetration electrode penetrates the semiconductor package. The penetration electrode is electrically connected to the circuit patterns. The described semiconductor package improves upon important characteristics such as size, reliability, warpage prevention, and heat dissipation.
申请公布号 US7858520(B2) 申请公布日期 2010.12.28
申请号 US20100841618 申请日期 2010.07.22
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHUNG QWAN HO
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
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