| 摘要 |
A testing device (1) for a lamp (3) operated at a nominal voltage (Vn) and at a nominal frequency (fn), having a capacitive coupling of a test voltage (Vp) at a testing frequency of (fp) to the lamp (3), wherein a coupled test voltage (Vpa) corresponds to the nominal voltage (Vn), and a coupled test frequency (fpa) corresponds to the nominal frequency (fn). The testing device is capable of testing a gas-filled lamp having integrated upstream electronics between power supply connections and a gas filled portion.
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