发明名称 CHARGE TRAP FLASH MEMORY USING GST NANODOT
摘要 <p>PURPOSE: A charge trap flash memory device with a GST nano dot is provided to improve the device property by increasing the trapped charge quantity and increasing trap density. CONSTITUTION: A semiconductor substrate(110) includes a source region and a drain region separated by a channel region. A tunneling insulating layer is formed on the channel region of the semiconductor substrate. A chalcogenide based compound nano dot is formed on the tunneling insulation layer. A blocking insulation layer(140) is formed on the tunneling insulation layer to cover the chalcogenide based compound nano dot.</p>
申请公布号 KR101003451(B1) 申请公布日期 2010.12.28
申请号 KR20090065764 申请日期 2009.07.20
申请人 SNU R&DB FOUNDATION 发明人 HWANG, CHEOL SEONG
分类号 H01L27/115 主分类号 H01L27/115
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