发明名称 |
METHOD OF INSPECTING TEMPLATE FOR NANOIMPRINT |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of inspecting a template for nanoimprints for inspecting fine patterns precisely. SOLUTION: The method of inspecting a template for nanoimprints includes: the process for applying light to the template 100 from the back side of the template 100 for nanoimprints where patterns are formed on the surface; the process for detecting near-field light generated near the surface of the template 100 by irradiation with light; and the process for inspecting the template 100, based on the detected near-field light. COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2010286309(A) |
申请公布日期 |
2010.12.24 |
申请号 |
JP20090139275 |
申请日期 |
2009.06.10 |
申请人 |
TOSHIBA CORP |
发明人 |
KASHIWAGI HIROYUKI;FUKUHARA KAZUYA |
分类号 |
G01N21/27;B29C59/00;B29L9/00;G01Q60/18;H01L21/027 |
主分类号 |
G01N21/27 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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