发明名称 METHOD OF INSPECTING TEMPLATE FOR NANOIMPRINT
摘要 PROBLEM TO BE SOLVED: To provide a method of inspecting a template for nanoimprints for inspecting fine patterns precisely. SOLUTION: The method of inspecting a template for nanoimprints includes: the process for applying light to the template 100 from the back side of the template 100 for nanoimprints where patterns are formed on the surface; the process for detecting near-field light generated near the surface of the template 100 by irradiation with light; and the process for inspecting the template 100, based on the detected near-field light. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010286309(A) 申请公布日期 2010.12.24
申请号 JP20090139275 申请日期 2009.06.10
申请人 TOSHIBA CORP 发明人 KASHIWAGI HIROYUKI;FUKUHARA KAZUYA
分类号 G01N21/27;B29C59/00;B29L9/00;G01Q60/18;H01L21/027 主分类号 G01N21/27
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