发明名称 HOLE CLUSTER TEST METHOD
摘要 PURPOSE: A hole cluster test method is provided to analyze and process an image which photographs a hole cluster and measure sizes and locations of holes of the hole cluster, thereby testing whether the hole cluster is defective. CONSTITUTION: A test target including holes is photographed. A histogram of the photographed image is analyzed(S20). The histogram of the photographed image is controlled to easily process the photographed image. Fourier transform is performed in the image(S21). Band pass filtering is performed in the converted image to remove a noise component(S22). The size and locations of the holes are measured(S23).
申请公布号 KR20100135101(A) 申请公布日期 2010.12.24
申请号 KR20090053564 申请日期 2009.06.16
申请人 INDUSTRY-ACADEMIC COOPERATION FOUNDATION, DANKOOKUNIVERSITY 发明人 HUH, KYUNG MOO;HAN, KWANG HEE
分类号 G06T7/00;G01B11/30;G01N21/88 主分类号 G06T7/00
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