发明名称 NON-TOUCH PROPER VIBRATION CHARACTERISTICS MEASUREMENT DEVICE
摘要 <p>PURPOSE: A non-contact type apparatus for measuring the proper vibration characteristic of a structure is provided to easily perform measurement by spacing the measuring unit from the structure. CONSTITUTION: A non-contact type apparatus for measuring the proper vibration characteristic of a structure includes a vibration applying unit(10), a measuring unit(20), and an analyzing unit(30). The vibration applying unit applies vibration to a structure(100). The measuring unit is spaced apart from the structure and measures a signal including the proper vibration of the structure. The analyzing unit obtains the measured signal and transforms the signal into a frequency form.</p>
申请公布号 KR20100134989(A) 申请公布日期 2010.12.24
申请号 KR20090053380 申请日期 2009.06.16
申请人 MECHASYS CO., INC.;CATHOLIC UNIVERSITY OF DAEGU INDUSTRY ACADEMIC COOPERATION FOUNDATION 发明人 KIM, JUNG YUN;AHN, HYUNG EUN;CHOI, SUNG BAE;KIM, JI HOON
分类号 G01M7/02;G01N29/12;G01N29/46 主分类号 G01M7/02
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