发明名称 |
NON-TOUCH PROPER VIBRATION CHARACTERISTICS MEASUREMENT DEVICE |
摘要 |
<p>PURPOSE: A non-contact type apparatus for measuring the proper vibration characteristic of a structure is provided to easily perform measurement by spacing the measuring unit from the structure. CONSTITUTION: A non-contact type apparatus for measuring the proper vibration characteristic of a structure includes a vibration applying unit(10), a measuring unit(20), and an analyzing unit(30). The vibration applying unit applies vibration to a structure(100). The measuring unit is spaced apart from the structure and measures a signal including the proper vibration of the structure. The analyzing unit obtains the measured signal and transforms the signal into a frequency form.</p> |
申请公布号 |
KR20100134989(A) |
申请公布日期 |
2010.12.24 |
申请号 |
KR20090053380 |
申请日期 |
2009.06.16 |
申请人 |
MECHASYS CO., INC.;CATHOLIC UNIVERSITY OF DAEGU INDUSTRY ACADEMIC COOPERATION FOUNDATION |
发明人 |
KIM, JUNG YUN;AHN, HYUNG EUN;CHOI, SUNG BAE;KIM, JI HOON |
分类号 |
G01M7/02;G01N29/12;G01N29/46 |
主分类号 |
G01M7/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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