发明名称 METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: The capacitor forming method in which the bottom electrode of the cylindrical shape controls auger or the phenomenon falling down and the capacitor forming method of the semiconductor device more a lot secures the electrostatic capacity is exhibited. CONSTITUTION: The electrode separation process(501) is proceed the chemical mechanical polishing process so that the first stray pinned layer pattern of the lower part expose. The first stray pinned layer pattern is penetratingly formed in which a part of the first stray pinned layer pattern is eliminated and which exposes the mold layer of the lower part.
申请公布号 KR20100135095(A) 申请公布日期 2010.12.24
申请号 KR20090053557 申请日期 2009.06.16
申请人 HYNIX SEMICONDUCTOR INC. 发明人 NAM, BYUNG HO
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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