发明名称 PARTICLE BEAM IRRADIATION APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a particle beam irradiation apparatus achieving a highly accurate beam irradiating position close to actualization based on actual data. <P>SOLUTION: Each of X direction and Y direction inverse mapping mathematical expression models is a polynomial including both of two variables when displaying target irradiation position coordinates on the irradiation position plane of a charged particle beam by the two variables. An unknown coefficient included in the polynomial is obtained by the following processes: two or more sets of preset X direction and Y direction command values are inputted to X direction and Y direction scanning electromagnets to thereby control the charged particle beam; and the actual data of respective actually irradiated irradiation position coordinates are subjected to a weighted least squares method for performing low weighting on some of the data. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010284513(A) 申请公布日期 2010.12.24
申请号 JP20100102084 申请日期 2010.04.27
申请人 MITSUBISHI ELECTRIC CORP 发明人 IWATA TAKAAKI
分类号 A61N5/10;G21K5/04 主分类号 A61N5/10
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