| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To achieve reduction in size regardless of the number of bump groups of a probe card while securing electric connection of the probe card with a test head. <P>SOLUTION: A slider member 20 of a connector body unit 10Ai is brought into a locked state to a lock part 14 on a wiring board 12, and lower contact parts of contact terminals 32ai, 32'ai, 34ai and 34'ai are allowed to abut on a contact pad group 12E of the wiring board 12. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
