| 发明名称 |
SYSTEMS FOR INSPECTION OF SHROUDS |
| 摘要 |
A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.
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| 申请公布号 |
US2010321048(A1) |
申请公布日期 |
2010.12.23 |
| 申请号 |
US20100871472 |
申请日期 |
2010.08.30 |
| 申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
ANDARAWIS EMAD ANDARAWIS;UMEH CHUKWUELOKA OBIORA |
| 分类号 |
G01R27/08 |
主分类号 |
G01R27/08 |
| 代理机构 |
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代理人 |
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| 主权项 |
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