发明名称 Die-warpage compensation structures for thinned-die devices, and methods of assembling same
摘要 A back-side lamination (BSL) is applied after thinning a microelectronic die. The BSL is configured to be a thermal-expansion complementary structure to a metal wiring interconnect layout that is disposed on the active side of the microelectronic die.
申请公布号 US2010320576(A1) 申请公布日期 2010.12.23
申请号 US20090456638 申请日期 2009.06.18
申请人 HU CHUAN 发明人 HU CHUAN
分类号 H01L23/31;H01L21/302 主分类号 H01L23/31
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