发明名称 METHOD OF FABRICATING DUAL POLY-GATE IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: The dual-poly gate formation method of the semiconductor device eliminates the chemical oxide film in which the boron is accumulated through the first cleaning. CONSTITUTION: The gate insulating layer(120) is formed on the semiconductor substrate(110). The semiconductor substrate has the first area(101) and the second part(102). The polysilicon layer doped to N type impurity ion is formed on the gate insulating layer. The polysilicon layer is heat-treated and the type polygate(131) and p-type polygate(132) are formed.
申请公布号 KR20100134450(A) 申请公布日期 2010.12.23
申请号 KR20090053074 申请日期 2009.06.15
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOON, HYO GEUN;PARK, JI YONG;LEE, SUN JIN
分类号 H01L21/8238;H01L21/336 主分类号 H01L21/8238
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