发明名称 |
METHOD OF FABRICATING DUAL POLY-GATE IN SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: The dual-poly gate formation method of the semiconductor device eliminates the chemical oxide film in which the boron is accumulated through the first cleaning. CONSTITUTION: The gate insulating layer(120) is formed on the semiconductor substrate(110). The semiconductor substrate has the first area(101) and the second part(102). The polysilicon layer doped to N type impurity ion is formed on the gate insulating layer. The polysilicon layer is heat-treated and the type polygate(131) and p-type polygate(132) are formed.
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申请公布号 |
KR20100134450(A) |
申请公布日期 |
2010.12.23 |
申请号 |
KR20090053074 |
申请日期 |
2009.06.15 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
YOON, HYO GEUN;PARK, JI YONG;LEE, SUN JIN |
分类号 |
H01L21/8238;H01L21/336 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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