发明名称 METHOD FOR MANUFACTURING SOI SUBSTRATE
摘要 The present invention provides a method for manufacturing an SOI substrate including at least: an oxygen ion implantation step of ion-implanting oxygen ions from one main surface of a single-crystal silicon substrate to form an oxygen ion implanted layer; and a heat treatment step of performing a heat treatment with respect to the single-crystal silicon substrate having the oxygen ion implanted layer formed therein to change the oxygen ion implanted layer into a buried oxide film layer, wherein acceleration energy for the oxygen ion implantation is previously determined from a thickness of the buried oxide film layer to be obtained, and the oxygen ion implantation step is carried out with the determined acceleration energy to manufacture the SOI substrate. Thereby, it is possible to provide an SOI substrate manufacturing method that enables efficiently manufacturing an SOI substrate having a continuous and uniform thin buried oxide film layer.
申请公布号 US2010323502(A1) 申请公布日期 2010.12.23
申请号 US20080449347 申请日期 2008.02.19
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 TAKENO HIROSHI;ISHIZUKA TOHRU;NOTO NOBUHIKO
分类号 H01L21/762 主分类号 H01L21/762
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