发明名称 PHASE DETECTING APPARATUS, TEST APPARATUS AND ADJUSTING METHOD
摘要 Provided is a phase detecting apparatus that detects a phase difference between signals, comprising a phase comparing section that sequentially delays a second input signal relative to a first input signal, according to a set value, and that compares a phase of the second input signal to a phase of the first input signal each time a relative phase between the input signals changes; and a delay adjusting section that adjusts in advance a delay amount of a signal in the phase comparing section. The delay adjusting section includes a signal generating section that generates a first adjustment signal and a second adjustment signal, which has a period that is shorter than a period of the first adjustment signal by an amount corresponding to the set value, and inputs the first adjustment signal and the second adjustment signal to the phase comparing section as the first input signal and the second input signal, respectively; and an adjusting section that adjusts a delay amount of the phase in the phase comparing section based on the phase comparison result by the phase comparing section between the first adjustment signal and the second adjustment signal.
申请公布号 US2010321001(A1) 申请公布日期 2010.12.23
申请号 US20100753796 申请日期 2010.04.02
申请人 ADVANTEST CORPORATION 发明人 ICHIYAMA KIYOTAKA
分类号 G01R25/00;H03D13/00 主分类号 G01R25/00
代理机构 代理人
主权项
地址