发明名称 |
CHARGED PARTICLE RADIATION DEVICE |
摘要 |
<p>Disclosed is a high-resolution, high-throughput charged particle radiation device that attenuates, in a short amount of time, the characteristic vibrations of ion pumps, said vibrations being excited by the reaction force when a stage is driven. Said charged particle radiation device also prevents power loops and current loops. The charged particle radiation device is provided with: a sample chamber (4) inside which a sample (3) is disposed; a charged particle radiation optical tube (1) for irradiating the sample (3) with charged particles (10); and ion pumps (2a, 2b) that evacuate the interior of the charged particle radiation optical tube (1). A frame (16) is fixed in the sample chamber (4) facing one end of the ion pumps (2a, 2b), and vibration-absorbing bodies are provided between the frame (16) and the one end of the ion pumps (2a, 2b). Each vibration-absorbing body comprises a layered structure in which a viscoelastic sheet (20a, 20b) is sandwiched between metal plates (18a, 18b, 21a, 21b).</p> |
申请公布号 |
WO2010146790(A1) |
申请公布日期 |
2010.12.23 |
申请号 |
WO2010JP03698 |
申请日期 |
2010.06.03 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION;TSUJI, HIROSHI;ISHIGURO, KOUJI;TACHIBANA, ICHIRO;SUZUKI, NAOMASA;ONUKI, KATSUNORI |
发明人 |
TSUJI, HIROSHI;ISHIGURO, KOUJI;TACHIBANA, ICHIRO;SUZUKI, NAOMASA;ONUKI, KATSUNORI |
分类号 |
H01J37/16;F16F1/40;F16F15/04;H01J37/18 |
主分类号 |
H01J37/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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