An X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same,申请号GB20080017504-传众专利搜索

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发明名称	An X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same
摘要
申请公布号	GB2453633(B)	申请公布日期	2010.12.22
申请号	GB20080017504	申请日期	2008.09.24
申请人	RIGAKU CORPORATION	发明人	TETSUYA OZAWA;RYUJI MATSUO;GO FUJINAWA;AKIRA ECHIZENYA
分类号	G01N23/207	主分类号	G01N23/207
代理机构		代理人
主权项
地址

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