发明名称 |
ADJUSTABLE TEST PATTERN RESULTS LATENCY |
摘要 |
A digital test instrument and a test method provide adjustable results latency. A digital test instrument includes a pattern controller configured to generate a sequence of test patterns, responsive, at least in part, to a pass/fail result, a pattern memory configured to supply the generated sequence of test patterns to a unit under test, a pattern results collection unit configured to receive at least one result value from the unit under test and to determine a pass/fail result for at least one supplied test pattern, and a synchronization unit configured to provide a no-result indication to the pattern controller during a preset number of pattern cycles following the start of a test, the preset number of pattern cycles based on a results latency of the test instrument, and to provide pass/fail results to the pattern controller after the preset number of pattern cycles. |
申请公布号 |
EP2212787(A4) |
申请公布日期 |
2010.12.22 |
申请号 |
EP20080838186 |
申请日期 |
2008.10.10 |
申请人 |
TERADYNE, INC. |
发明人 |
MCGOLDRICK, MICHAEL, F.;BORROZ, WILLIAM, T.;ENG, STEPHEN, K.;MILLEY, DAVID, A. |
分类号 |
G06F11/00;G01R31/28;G01R31/3181;G01R31/319;G01R31/3193;G11C29/56 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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