| 发明名称 |
RFID device tester and method |
| 摘要 |
<p>The present invention refers to a method of testing a radio frequency identification (RFID) device, comprising:
shifting an optimum operating frequency of the device from a natural resonant frequency to a shifted resonant frequency; and
reading the device at a frequency other than the natural resonant frequency.</p> |
| 申请公布号 |
EP2264678(A1) |
申请公布日期 |
2010.12.22 |
| 申请号 |
EP20100011255 |
申请日期 |
2004.02.13 |
| 申请人 |
AVERY DENNISON CORPORATION |
发明人 |
FORSTER, IAN J.;WEAKLEY, THOMAS C.;KINGSTON, BENJAMIN |
| 分类号 |
G08B21/00;G06K7/00;G06K7/10;G08B13/14 |
主分类号 |
G08B21/00 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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