发明名称 SALT AND PHOTORESIST COMPOSITION CONTAINING THE SAME
摘要 <p>PURPOSE: A photoresist composition containing salts is provided to obtain photoresist pattern with excellent line edge roughness and focus margin(DOF). CONSTITUTION: A salt represented by the formula (a1), wherein Q1 and Q2 each independently represent a fluorine atom or a C1-C4 perfluoroalkyl group, X1 represents -CO-O-X^a1- or -CH2-O-X^a2- wherein X^a1 and X^a2 independently each represent a C1-C15 alkylene group and one or more -CH2- in the alkylene group can be replaced by -O- or -CO-, Y1 represents a C3-C36 alicyclic hydrocarbon group or a C6-C24 aromatic hydrocarbon group, and the alicyclic hydrocarbon group and the aromatic hydrocarbon group can have one or more substituents, and one or more -CH2- in the alicyclic hydrocarbon group can be replaced by -O- or -CO-, an Z^+ represents an organic cation.</p>
申请公布号 KR20100133899(A) 申请公布日期 2010.12.22
申请号 KR20100054357 申请日期 2010.06.09
申请人 SUMITOMO CHEMICAL CO., LTD. 发明人 ICHIKAWA KOJI;SUGIHARA MASAKO;SAKAMOTO HIROMU
分类号 C07C309/12;C07C381/12;G03F7/004;H01L21/027 主分类号 C07C309/12
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