发明名称 SEMICONDUCTOR MEMORY DEVICE HAVING PHYSICALLY SHARED DATA PATH AND TEST DEVICE FOR THE SAME
摘要 PURPOSE: A semiconductor memory device having a physically shared data path and a test device for the same are provided to perform test data which is extracted by shared data path in case that a data path is physically shared. CONSTITUTION: A semiconductor memory device physically shares data path between chips. A semiconductor memory device comprises a data output driver(120). The data output driver compares add data and first and the second reference data. A data output driver supplies voltage to a data input/output pad. The voltage has a level corresponding to a comparison result.
申请公布号 KR20100133192(A) 申请公布日期 2010.12.21
申请号 KR20090051950 申请日期 2009.06.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, HWAN WOOK
分类号 G11C7/10;G11C29/00 主分类号 G11C7/10
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