发明名称 Semiconductor memory device having a floating storage bulk region capable of holding/emitting excessive majority carriers
摘要 A semiconductor memory device includes: a semiconductor layer formed on an insulating layer; a plurality of transistors formed on the semiconductor layer and arranged in a matrix form, each of the transistors having a gate electrode, a source region and a drain region, the electrodes in one direction constituting word lines; source contact plugs connected to the source regions of the transistors; drain contact plugs connected to the drain regions of the transistors; source wirings each of which commonly connects the source contact plugs, the source wirings being parallel to the word lines; and bit lines formed so as to cross the word lines and connected to the drain regions of the transistors via the drain contact plugs. Each of the transistors has a first data state having a first threshold voltage and a second data state having a second threshold voltage.
申请公布号 US7855920(B2) 申请公布日期 2010.12.21
申请号 US20100725796 申请日期 2010.03.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OHSAWA TAKASHI
分类号 G11C16/04;G11C7/18;G11C11/404;G11C11/406;G11C11/4076;G11C11/4097;H01L21/8242;H01L21/84;H01L27/108;H01L27/12;H01L29/76 主分类号 G11C16/04
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