摘要 |
A variation in manufacturing total costs is obtained by using an excessive loss amount caused by unnecessarily discarding elemental semiconductor integrated circuits occurring as a result of a negative result being obtained in an elemental test but a positive result obtained from a device test, and a short loss amount caused by packaging elemental semiconductor integrated circuits for semiconductor integrated circuit devices that are discarded as a result of a positive result being obtained from the elemental test but a negative result being obtained from the device test. A new operating frequency is determined by using the variation in manufacturing total costs with respect to an operating frequency.
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