发明名称 System and method for providing temperature correction in a crystal oscillator
摘要 A system and method for providing temperature compensation in a oscillator component (such as a crystal oscillator component) that includes a closely-located temperature sensing device. The crystal oscillator component in example systems and methods is exposed to a temperature profile during a calibration procedure. Temperature and frequency data are collected and applied to coefficient generating function according to a temperature compensation model to generate a set of coefficients that are used in the temperature compensation model in an application device. The generated coefficients are stored in a coefficient memory accessible to an application device during operation.
申请公布号 US7855608(B2) 申请公布日期 2010.12.21
申请号 US20080331185 申请日期 2008.12.09
申请人 SIRF TECHNOLOGY 发明人 BABITCH DANIEL
分类号 H03B5/04;H03B5/36;H03L1/02 主分类号 H03B5/04
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