发明名称 Semiconductor device structures including nickel plated aluminum, copper, and tungsten structures
摘要 A method of activating a metal structure on an intermediate semiconductor device structure toward metal plating. The method comprises providing an intermediate semiconductor device structure comprising at least one first metal structure and at least one second metal structure on a semiconductor substrate. The at least one first metal structure comprises at least one aluminum structure, at least one copper structure, or at least one structure comprising a mixture of aluminum and copper and the at least one second metal structure comprises at least one tungsten structure. One of the at least one first metal structure and the at least one second metal structure is activated toward metal plating without activating the other of the at least one first metal structure and the at least one second metal structure. An intermediate semiconductor device structure is also disclosed.
申请公布号 US7855454(B2) 申请公布日期 2010.12.21
申请号 US20070702286 申请日期 2007.02.05
申请人 MICRON TECHNOLOGY, INC. 发明人 AKRAM SALMAN;WARK JAMES M.;HIATT WILLIAM M.
分类号 H01L23/48;H01L23/52;H01L29/40 主分类号 H01L23/48
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