发明名称 A TARGET MATERIAL, A SOURCE, AN EUV LITHOGRAPHIC APPARATUS AND A DEVICE MANUFACTURING METHOD USING THE SAME
摘要 <p>A target material is configured to be used in a source constructed and arranged to generate a radiation beam having a wavelength in an extreme ultraviolet range. The target material includes a Gd-based composition configured to modify a melting temperature of Gd.</p>
申请公布号 KR20100133443(A) 申请公布日期 2010.12.21
申请号 KR20107023496 申请日期 2009.03.20
申请人 ASML NETHERLANDS B.V. 发明人 KRIVTSUN VLADIMIR MIHAILOVITC;BANINE VADIM YEVGENYEVICH;BLEEKER ARNO JAN;IVANOV VLADIMIR VITALEVITCH;KOSHELEV KONSTANTIN NIKOLAEVITCH;MOORS JOHANNES HUBERTUS JOSEPHINA;CHURILOV SERGEY;GLUSHKOV DENIS
分类号 G03F7/004;G03F7/20;H01L21/027;H05G2/00 主分类号 G03F7/004
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