发明名称 SiC crystal and semiconductor device
摘要 The present invention discloses a SiC crystal, comprising: acceptor impurities that are in a concentration greater than 5×1017 cm−3; donor impurities that are in a concentration less than 1×1019 cm−3 and greater than the concentration of the acceptor impurities. The present invention discloses a semiconductor device, comprising: a SiC fluorescent layer having acceptor impurities that are in a concentration greater than 5×1017 cm−3 and donor impurities that are in a concentration less than 1×1019 cm−3 and greater than the concentration of the acceptor impurities; and a light emission layer that is layered on the SiC fluorescent layer and emits excitation light for the SiC fluorescent layer.
申请公布号 US7855385(B2) 申请公布日期 2010.12.21
申请号 US20080152016 申请日期 2008.05.12
申请人 MEIJO UNIVERSITY;NATIONAL UNIVERSITY CORPORATION KYOTO INSTITUTE OF TECHNOLOGY 发明人 KAMIYAMA SATOSHI;AMANO HIROSHI;AKASAKI ISAMU;IWAYA MOTOAKI;YOSHIMOTO MASAHIRO;KINOSHITA HIROYUKI
分类号 H01L31/0312 主分类号 H01L31/0312
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