发明名称 Apparatus, method and program product for suppressing waviness of features to be printed using photolithographic systems
摘要 A method for minimizing rippling of features when imaged on a surface of a substrate using a mask. The method includes the steps of determining a deviation between a first representation of the design and a second representation of an image of the design at each of a plurality of evaluation points for each section of a plurality of sections of the design; determining an amount of modification of the design at each section based on an evaluation of the plurality of evaluation points; and modifying the design at each section by the amount determined in the previous step.
申请公布号 US7856606(B2) 申请公布日期 2010.12.21
申请号 US20050092983 申请日期 2005.03.30
申请人 ASML MASKTOOLS B.V. 发明人 EURLINGS MARKUS FRANCISCUS ANTONIUS;MULDER MELCHIOR;LAIDIG THOMAS;HOLLERBACH UWE
分类号 G06F17/50;G03F1/00;G03F1/36;G03F7/20;H01L21/027 主分类号 G06F17/50
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