| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device and a testing method which uses it for simultaneously verifying output signals of a plurality of semiconductor integrated circuits at a double-speed, without causing the number of usable tester channels to decrease. SOLUTION: Concerning the tester channels TCH, a level determination part 1 determines whether a signal level of an output signal of a tested semiconductor integrated circuit input through an input buffer B2 satisfies a regulated value and outputs a level determination signal LS. When a double-speed test mode is designated by double-speed mode designation signals, a level determination signal multiplexing part 2 outputs to multiplex the level determination signal LS of a separate channel to the level determination signal LS output from the level determination part 1. When the double-speed test mode is canceled, the level determining signal LS output from the level determining section 1 is independently output. An expected value comparator 3 compares the output T of the level determination signal multiplexing part 2 with the expected value at a strobe time STB. COPYRIGHT: (C)2011,JPO&INPIT
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