发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 A semiconductor device includes: a channel region formed in a semiconductor substrate; a source region formed on one side of the channel region; a drain region formed on the other side of the channel region; a gate electrode formed on the channel region via a gate insulating film; and a stress-introducing layer that applies stress to the channel region, the semiconductor device having a stress distribution in which source region-side and drain region-side peaks are positioned between a pn junction boundary of the channel region and the source region and a pn junction boundary of the channel region and the drain region.
申请公布号 US2010314694(A1) 申请公布日期 2010.12.16
申请号 US20100783248 申请日期 2010.05.19
申请人 SONY CORPORATION 发明人 MAYUZUMI SATORU;WAKABAYASHI HITOSHI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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