发明名称 ADJUSTING CURRENT RATIOS IN INDUCTIVELY COUPLED PLASMA PROCESSING SYSTEMS
摘要 A plasma processing system for generating plasma to process at least a wafer. The plasma processing system may include a first coil for conducting a first current for sustaining at least a first portion of the plasma. The plasma processing system may also include a second coil for conducting a second current for sustaining at least a second portion of the plasma. The plasma processing system may also include a power source for powering the first current and the second current. The plasma processing system may also include a parallel circuit for adjusting one of the amperage of the first current and the amperage of the second current. The parallel circuit may be electrically coupled between the power source and at least one of the first coil and the second coil. The parallel circuit may include an inductor and a variable capacitor electrically connected in parallel to each other.
申请公布号 US2010314048(A1) 申请公布日期 2010.12.16
申请号 US20100728112 申请日期 2010.03.19
申请人 LONG MAOLIN;JAFARIAN-TEHRANI SEYED JAFAR 发明人 LONG MAOLIN;JAFARIAN-TEHRANI SEYED JAFAR
分类号 H05H1/34;G05F1/00;H01L21/3065 主分类号 H05H1/34
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