Testing method for a semiconductor integrated circuit device, semiconductor integrated circuit device and testing system

摘要

A method that divides semiconductor integrated circuit devices (corresponding to S1 and S2) into a plurality of groups and tests them simultaneously has the semiconductor integrated circuit devices operate with a clock signal (corresponding to CLK1 and CLK2) having a frequency different from that in other groups in at least one group. A test is performed without decreasing the number of chips tested at one time.