发明名称 TRENCHED POWER MOSFET AND MANUFACTURING METHOD THEREOF
摘要 <p>A trenched power MOSFET includes: an N-type substrate (1) and an N-type epitaxial layer (2) growing on the substrate (1); a P-well region (10) formed on the epitaxial layer (2), a source region (11) formed over the P-well region(10) and a first oxide layer (12) covering the source region (11); a P+ injected region (15) located in the P-well region (10) under the source region (11); which characterized in that: including many trenches which punch through the source region (11) and the P-well region (10) and contact the epitaxial layer (2),wherein the bottom trenches have a thick oxide layer (16) with thickness of 0.15-0.25µm; a method of manufacturing the trenched power MOSFET is provided. The trenched power MOSFET reduces the gate-drain capacitance of the MOSFET in the case of not affecting the threshold voltage of the MOSFET, thus improving its switching speed.</p>
申请公布号 WO2010142219(A1) 申请公布日期 2010.12.16
申请号 WO2010CN73569 申请日期 2010.06.04
申请人 WILL SEMICONDUCTOR LTD.;JI, GANG;GU, JIANPING;NI, KAIBIN;ZHONG, TIANBING 发明人 JI, GANG;GU, JIANPING;NI, KAIBIN;ZHONG, TIANBING
分类号 H01L29/78;H01L21/336;H01L21/8238 主分类号 H01L29/78
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