发明名称 SIGNAL PROCESSING APPARATUS INCLUDING BUILT-IN SELF TEST DEVICE AND METHOD FOR TESTING THEREBY
摘要 A signal processing apparatus according to the present invention includes: a built-in self test device dividing a digital reference clock signal to output an I division signal and a Q division signal, shifting the I division signal and the Q division signal by predetermined angles, converting the shifted I and Q signal into analog signals to output an I testing signal and a Q testing signal; and a signal processing receiving and processing the I testing signal and the Q testing signal.
申请公布号 US2010318865(A1) 申请公布日期 2010.12.16
申请号 US20090483726 申请日期 2009.06.12
申请人 INTEGRANT TECHNOLOGIES INC. 发明人 KIM JAE WAN;JEONG MINSU
分类号 G01R31/28;G06F11/00 主分类号 G01R31/28
代理机构 代理人
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