发明名称 SPECTRALLY CONTROLLABLE LIGHT SOURCES IN INTERFEROMETRY
摘要 The time delay (and therefore the OPD) between object and reference beams in an interferometer is manipulated by changing the spectral properties of the source. The spectral distribution is tuned to produce a modulation peak at a value of OPD equal to the optical distance between the object and reference arms of a Fizeau interferometer, thereby enabling the use of its common-axis configuration to carry out white-light measurements free of coherence noise. Unwanted interferences from other reflections in the optical path are also removed by illuminating the object with appropriate spectral characteristics. OPD scanning is implemented without mechanical means by altering the source spectrum over time so as to shift the peak location by a predetermined scanning step between acquisition frames. Finally, the spectrum is controlled on a pixel-by-pixel basis to create a virtual surface that matches the profile of a particular sample surface.
申请公布号 US2010315650(A1) 申请公布日期 2010.12.16
申请号 US20100816091 申请日期 2010.06.15
申请人 OLSZAK ARTUR G 发明人 OLSZAK ARTUR G.
分类号 G01B11/02 主分类号 G01B11/02
代理机构 代理人
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