发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device, capable of preventing corrosion caused by cleaning. SOLUTION: The method for manufacturing the semiconductor device includes: a film-forming step of forming a film on a surface of a substrate by supplying a plurality of starting materials into a treatment chamber; and a cleaning step of cleaning the interior of the treatment chamber by supplying a fluorine-containing cleaning gas into the treatment chamber. The cleaning step includes: a first heating step of heating the interior of the treatment chamber at a first temperature for a prescribed period; a temperature-raising step of raising the temperature from the first temperature to a second temperature; and a second heating step of heating the interior of the treatment chamber at the second temperature for a prescribed period; wherein the first and second temperatures are each a prescribed temperature within the range of 500-700°C. COPYRIGHT: (C)2011,JPO&INPIT
|
申请公布号 |
JP2010280945(A) |
申请公布日期 |
2010.12.16 |
申请号 |
JP20090134695 |
申请日期 |
2009.06.04 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
KYODA MASAYUKI |
分类号 |
C23C16/44;H01L21/205;H01L21/28;H01L21/285 |
主分类号 |
C23C16/44 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|