发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device, capable of preventing corrosion caused by cleaning. SOLUTION: The method for manufacturing the semiconductor device includes: a film-forming step of forming a film on a surface of a substrate by supplying a plurality of starting materials into a treatment chamber; and a cleaning step of cleaning the interior of the treatment chamber by supplying a fluorine-containing cleaning gas into the treatment chamber. The cleaning step includes: a first heating step of heating the interior of the treatment chamber at a first temperature for a prescribed period; a temperature-raising step of raising the temperature from the first temperature to a second temperature; and a second heating step of heating the interior of the treatment chamber at the second temperature for a prescribed period; wherein the first and second temperatures are each a prescribed temperature within the range of 500-700°C. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010280945(A) 申请公布日期 2010.12.16
申请号 JP20090134695 申请日期 2009.06.04
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 KYODA MASAYUKI
分类号 C23C16/44;H01L21/205;H01L21/28;H01L21/285 主分类号 C23C16/44
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