发明名称 X-RAY INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an X-ray inspection apparatus capable of accurately detecting a defective shape of a content tightly packaged by a packaging material. SOLUTION: The X-ray inspection apparatus includes an image generation phase for detecting an X ray permeating an inspection object W containing the content 81 packaged with the packaging material 91 and generating an original image, a packaging state image generation phase for clipping an area image corresponding to the content 81 out of the original image corresponding to the inspection object W and generating a packaging state image showing a portion of the content 81 crushed by the packaging material 91, and a crushed portion detection phase for detecting on the basis of the packaging state image that the content 81 of the inspection object W has been partly crushed by the packaging material 91. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010281681(A) 申请公布日期 2010.12.16
申请号 JP20090135165 申请日期 2009.06.04
申请人 ANRITSU SANKI SYSTEM CO LTD 发明人 INOUE MANABU
分类号 G01N23/04 主分类号 G01N23/04
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