发明名称 IMAGING INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide constitution and a technique of an imaging inspection method slightly changing resolving power when imaging to accurately remove a repeated pattern and detecting a flaw pattern. SOLUTION: When an object to be inspected having the repeated pattern is inspected, imaging is performed with resolving power, wherein the repeated cycle of the object to be inspected and the resolving power of a taken image become an integral ratio, in order to remove a normal repeated pattern from the taken image. A part 101' of the object to be inspected having the repeated pattern is imaged by a camera and the imaging timing of the camera is properly determined so as not only to obtain the taken image 151 but also to perform the imaging timing of the camera at an unequal interval. By this constitution, the imaging is performed with the resolving power, wherein the repeated cycle of the object to be inspected and the resolving power of the taken image become an integral ratio not only to remove the normal repeated pattern but also to detect the flaw pattern. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010281666(A) 申请公布日期 2010.12.16
申请号 JP20090134903 申请日期 2009.06.04
申请人 PANASONIC CORP 发明人 WAKITANI KOICHI;SUNOUCHI AKIHIRO;FUKUDA MASANORI
分类号 G01N21/956;G06T1/00 主分类号 G01N21/956
代理机构 代理人
主权项
地址